

We have found that ellipsometry can be used to provide an accurate measure of the glass transition temperature T_g of thin freely-standing polystyrene films. We have used this technique to perform a detailed study of T_g as a function of the film thickness h, the molecular weight M_w of the polymer and the thermal cycling of the films. Using ellipsometry, we have verified quantitatively the large h-dependent and M_w-dependent reductions in T_g measured previously for freely-standing polystyrene films using Brillouin light scattering [1]. Also, we have extended the T_g measurements to different M_w values.
[1] J.A. Forrest, K. Dalnoki-Veress and J.R. Dutcher, Phys.
Rev. E 56, 5705 (1997).
[WC12.02] Measurement of In-Plane CTE and Modulus of Polymer Thin-Films
C. K. Chiang (Polymer Division, NIST, Gaithersburg, MD)
Characterization of polymer thin-films for electronic
applications is important for the advancement of the
semiconductor industry. We have applied bending-plate
technique to study the residual stresses of polymer
thin-film materials. After coating polymer thin-film on a
wafer at high temperature, the curvature of the wafer
changed due to the difference in the thermal expansions. We
measured the curvatures of the wafer before and after the
coating of polymer. The stress of the polymer thin-film can
be computed from the measured curvatures using Stoney's
equation. The stress of the thin-film was measured as a
function of temperature. From stress-temperature curves, the
in-plane coefficient of thermal expansion and mechanical
modulus can be deduced. This measurement technique does not
require removal of thin-film from the substrate. This
non-destructive data is interest and unique, because it
involves polymer-substrate interface. Experimental results
for several polymers are discussed.
[WC12.03] Onset of Hole Formation in Freely-Standing Polystyrene Films
Connie Roth, Kari Dalnoki-Veress, John Dutcher (Department of Physics, University of Guelph)
We have obtained a sensitive measure of the onset of the
formation of holes in thin freely-standing polystyrene films
as the films are heated from room temperature. This
measurement was performed using a membrane deflection
experiment in which a small pressure difference across the
film is measured and controlled to within 0.1 Pa. The
experiment provides an objective measure of the initial
stages of hole formation over the entire film surface. The
dependence of the onset temperature for hole formation on
the film thickness and the pressure difference across the
film will be discussed.
[WC12.04] Mechanism of Hole Growth in Freely-Standing Polystyrene Films
Kari Dalnoki-Veress, Bernie Nickel, Connie Roth, John Dutcher (Department of Physics, University of Guelph)
Recently, we have measured the growth of holes in thin,
freely-standing polystyrene films in the melt state. For all
films, we observed exponential growth of the hole radius and
uniform thickening, with reductions in the characteristic
growth time as the film thickness was reduced. These results
are interpreted in terms of the dependence of the viscosity
on the shear strain rate associated with the hole growth
process. The hole growth measurement provides a novel probe
of non-linear viscoelastic effects in confined polymers.
[WC12.05] Viscoelastic properties of the free standing PS films
Yuxie Pu, Miriam Rafailovich, Jonathon Sokolov (Dept. of Material Science and Engingeering SUNY@Stony Brook), Olaf Bahr, Metin Tolan (Institut fur Experimentalphysik der Universitat Kiel), Tom Petersen (Dept. of E.E. Princeton University)
We have studied the viscoelastic properties of free standing
PS films by measuring the rate of the growth of holes as a
function of the molecular weight, thickness and temperature.
Samples were imaged by optical microscopy and atomic force
microscopy. No rim around the growing holes was observed,
indicating "viscous bursting". The radius grows
exponentially with time for thick films, but constant
velocity is found for thin films. The results show the
viscous effect dominates the bursting of the hole of thick
free standing films where the bulk 3.4 power law for
viscosity is found. however, for thin films, a weaker
dependence of viscosity on molecular weight is observed.
SIMS results show no observable diffusion perpendicular to
the free surface on the time scale of the hole-opening.
X-Ray reflectivity measurements show that thin free standing
films contract upon annealing with the same behaviour as the
supported film. These results will be interpreted in terms
of surface tension and elasitc driving forces.
Acknowledgement:We appreciated the suported of the National
Science Foundation Polymer Program(DMR9316157),the
Department of Energy(DE-FG02-93ER45481), and the MRSEC
program of the national Science Foundation(DMR9632525)
[WC12.06] X-ray Scattering Measurement of Free-standing Polystyrene films
K.W. Shin, Y. Pu, M.H Rafailovich, J. Sokolov (SUNY@Stony Brook), O. Seek, S. Sinha (ANL), M Tolan (Institut fur Experimentelle and Angewandte Physik der Universitat Kiel, Germany), A. Gibaud (U.du Maine Faculte des Sciences, France), R. Kolb (Exxon)
We used X-ray scattering to investigate surface capillary
waves of thin freestanding polymer films. Our previous
results showed that strong surface interactions can modify
the capillary wave spectrum and introduce unusual cut-off in
propagation frequencies(PRL,2731,1998). The study of
freestanding film, the polymer film standing without
substrate, can be a very good model. Different molecular
weight polystyrene were spun on the glass and floated on
aluminum plate having a 3mm-diameter hole in the center and
pre-annealed in vacuum at 120 ^oC. The specular
reflectivity, diffuse and longitudinal diffuse scattering
are measured as a function of film thickness and temperature
in vacuum. A distinct beating in the specula reflectivity
profile was observed in freestanding films more than
1200Åthick. We postulate that the beating may be due to
differences in film thickness when a resonant standing
capillary wave mode is established. The slope of diffuse
scattering profiles increased with film thickness.
[WC12.07] New Developments in the Glass Transition of Freely Standing Polymer Films
Johan Mattsson (Dept. of Experimental Physics, Chalmers University, Göteborg, Sweden), James A. Forrest (Dept. of Physics and Astronomy, University of Sheffield, Sheffield, U.K.)
We have used Brillouin Light Scattering (BLS) to
characterize the molecular weight dependence of the glass
transition temperature, T_g, for thin, freely standing
films of polystyrene. The freely standing films, with
thicknesses as small as 200 Åwere prepared from
monodisperse polymer with M_w values ranging from 115k to
2100k. For values of M_w (> 400k) we observe a T_g
value which depends on both the film thickness and the M_w
value; in agreement with previous BLS studies. For M_w <
\sim 350k, the measured T_g exhibited no discernible
variation with M_w value, suggesting a much weaker M_w
dependence. The behavior for these samples is characterised
by large decreases in the T_g value for films with
thickness h \leq 400 ÅThe contrast between the thermal
expansivities of the melt and glassy states was studied and
found not to be a strong function of the film thickness.
This is in contrast to the case for supported polymer films
where the T_g value becomes progressively harder to
measure for samples with smaller film thickness. The results
are discussed in terms of models used to describe anomalous
T_g behavior in confined systems.
[WC12.08] Temperature Effect on Dielectric Loss Response of Confined Ploymer
Sangmin Jeon, Yoon-Kyoung Cho, Steve Granick (Department of Materials Science and Engineering University of Illinois), Hiroshi Watanabe (Institute for Chemical Research Kyoto University)
Frequency dependence of the dielectric loss of thin
cis-polyisoprene films was measured at temperatures from
25oC to -60oC. To avoid the undesirable effects of surface
roughness, freshly cleaved atomically smooth mica was placed
between silver electrodes. The polymer samples of different
thickness, confined between mica to a definite thickness,
were spin-coated onto the mica and the thickness was
accurately measured by multiple beam interferometry. Though
the normal mode loss peak of the confined polymer did not
shift so much as the terminal zone peak of viscoelastic
relaxation, it was observed that not only the normal mode
but also segmental mode relaxation peaks were shifted to
lower frequency with decreasing sample thickness.
Preliminary measurements show that normal mode and segmental
mode relaxation display a different dependence on
temperature in thin film than in the bulk.
[WC12.09] Molecular Mobility in Polymer Thin Films
Kevin Tseng (Chemical Engineering and Applied Chemistry, Columbia University, New York NY 10027), Nicholas Turro (Chemistry, Columbia University, New York NY 10027), Christopher Durning (Chemical Engineering and Applied Chemistry, Columbia University, New York NY 10027)
Fluorescence recovery after photobleaching (FRAP) was used
to measure in-plane dye-probe diffusion coefficients, D, in
thin films of monodisperse polystyrene (PS) supported on
fused quartz substrates. The substrates were prepared with a
high density of surface hydroxyl groups which interact
favorably with repeat units of the polymer. The effects of
temperature and film thickness were investigated, at
temperatures above the bulk glass transition of the polymer,
Tg, and in the range of film thicknesses from 5-100 times
the radius of gyration Rg of individual polymer molecules.
As the film thickness decreases towards Rg the value of D
increase above the bulk values, with significant effects
first appearing in films about 20 times Rg. In the thinnest
films studied, about 4 Rg, the values of D lie as much as
two orders over bulk values. At the same time, the
temperature dependence of D becomes much weaker than in
bulk. Analysis by free volume theory indicates that apparent
values of both Tg and the thermal expansion coefficient for
liquid state decrease as the film thickness decreases. The
possible effects of surface segregation of the dye-probe are
discussed.
[WC12.10] Ultrathin Polymer Films: Probe Diffusion and Physical Aging Studies
D.B. Hall, J.M. Torkelson (Northwestern Univ., Evanston, IL 60208-3120 USA)
There are conflicting results in the research literature
regarding the range of influence of polymer-substrate
affinity on the dynamics of ultrathin polymer films. We
address this issue with fluorescence methods for in situ
monitoring of small molecule probe diffusion (coupled to
cooperative segmental mobility) and physical aging in
ultrathin polymer films. Studies to date near Tg in
supported films (on fused silica) of polystyrene,
poly(isobutyl methacrylate), and poly(2-vinyl pyridine) show
little effect of film thickness or polymer-substrate
affinity on polymer relaxation dynamics; only polystyrene
shows probe diffusion yielding any significant dependence on
film thickness for thicknesses < 150 nm. Physical aging of
polystyrene supported on (hydrophilic) fused silica and on a
hydrophobically modifed silica show little effect of film
thickness or substrate polarity in films as thin as 10 nm.
These studies indicate that specific polymer-substrate
interactions do not typically have a range influence on
ultrathin polymer film mobility of more than a few tens of
nanometers or less. Studies are underway on systems that may
show greater effects through major modification of Tg with
film thickness.
[WC12.11] Fluorescence Probe Determination of the Glass Transition Temperature (Tg) for Supported and Free-Standing Ultra-Thin Polymer Films.
Christopher C. White, Wen-li Wu (National Institute of Standards and Technology)
Recently, several different experimental results employing a
variety of techniques have suggested that Tg for ultra-thin
flexible polymer films becomes a function of film thickness
at approximately 100nm. These experiments can be divided
into two categories: experiments on supported films and
experiments on free-standing films, with the free standing
films showing the largest affect. There have been no
systematic studies on the effect of the degree of support on
the deviation of Tg. In this paper, results from a
fluorescence probe determination of the glass transition
temperature on a series of supported and partially supported
ultra-thin flexible polymer films will be discussed in
addition to the experimental details.
[WC12.12] Glass Transition Behavior of Polymer Thin Films
Shouren Ge, Miriam Rafailovich, Jonathan Sokolov (SUNY, Dept. of Materials Science and Engineering, Stony Brook, NY), Cynthia Buenviaje, Rene Overney (University of Washington, Seattle, WA), W. L. Wu , E. Lin (NIST, Gaithersburg, MD)
The glass transition behavior of polymer thin films has recently received a great amount of attention. A thin film has a large surface to volume ratio and polymer/substrate interaction which may lead to shift in the glass transition temperature. The glass transition behavior might be different with bulk and show thickness dependence. In this work, we propose a novel method for the characterization of surface glass transition behavior for the polymer thin films. The method to measure the glass transition temperature, Tg involves pressing a sharp cantilever tip against a sample with a certain load. The drive signal in the lateral direction was modulated sinusoidally and applied to the scanner of an atomic force microscopy (AFM). The depth of penetration can be evaluated by measuring the response amplitude of the cantilever in lateral direction. The response amplitude is monitored as a function of the temperature of the sample. Tg is determined from the temperature-amplitude curve. Spin coated poly(n-butyl methacrylate) (PBMA) and polystyrene (PS) thin films of thickness ranging from 15~250 nm were studied. It was found that for the PBMA films thinner than 50 nm or approx. 6Rg of this polymer Tg increases gradually as the film thickness decreases. These results will be directly compared with x-ray reflectivity measurements of changes in the expansion coefficients on the same films.
[WC12.13] The Character of the Glass Transition of Thin Supported Polymer Films
Shin Kawana (University of Cambridge, U.K.), R.A.L. Jones (University of Sheffield, U.K.)
We have used ellipsometry to study the thermal expansivity of thin polystyrene films on silicon substrates with thicknesses of 10-200nm. Using a cooling scan at 2K/min from the liquid state that was employed to avoid any effect of the thermal history we find well defined glass transitions; films with thickness > 60 nm show bulk like behaviour while for films with thickness < 60 nm the glass transition is shifted to lower temperatures, in agreement with many other studies. However more detailed analysis of the expansivities shows that for thinner films the transition width is broadened, while the strength of the transition, defined by the difference between the expansivities in the liquid and glassy state, is reduced, with the expansivity in the glassy state higher than in the bulk. We have also studied ageing effects by conducting a heating scan after isothermal annealing 20K below the bulk glass transition temperature. These show a relaxation peak in the expansivity for thicker films, with the strength of the peak reducing in magnitude for thinner films until for a 10 nm film no peak is visible. Both of these phenomena are consistent with the idea that a layer of roughly constant thickness, of order 10 nm, near the surface of the film has liquid like thermal properties at all temperatures.
[WC12.14] Dielectric Response of Polymer Films Confined between Mica Surfaces
Yoon-Kyoung Cho, Sangmin Jeon, Steve Granick (University of Illinois, Urbana, IL.), Hiroshi Watanabe (Kyoto University, Uji, Koto, JAPAN)
Dielectric response of organic thin films when confined
between opposed atomically-flat mica surfaces has been
investigated. The main idea, to prevent deleterious effects
of surface roughness, was to buffer the metal electrode by
an intervening dielectric layer of cleaved mica. Normal-mode
relaxation of cis-polyisoprene (Mn = 6,000 and 14,500
g-mole-1) within a surface forces apparatus and also
sandwiched between parallel sheets of mica were measured as
a function of film thickness. Although the peak of the
dielectric loss shifted to lower frequency by factor of only
2, the response at lower frequencies grew more slowly than
directly proportional to frequency, indicating a
distribution of relaxation times, and at a given frequency a
huge reduction of dielectric loss was observed as the film
thickness decreased. In a comparison with frequency
dependent shear dynamics, the peak of dielectric response
fell at significantly higher frequency than the peak of
mechanical response, showing that single-molecule motions
were not retarded so much as viscoelastic shear relaxations.
[WC12.15] Calorimetric Measurements of the Glass Transition in Nano-meter Pores
Joon-Yong Park, Gregory B. McKenna (NIST)
Controlled Pore Glasses of pore diameter ranging from 10 to 50 nm have been used as matrices to study the glass transition (Tg) of solutions of polystyrene in ortho-terphenyl in constrained geometries. Differential scanning calorimetry (DSC) techniques have been used to examine the change in the glass transition as a function of both pore size and concentration. Concentrations were chosen to vary from c* to 4 c*, where c* is the overlap concentration for the polymer chains. These results show the first calorimetric evidence that constraint and geometry may exhibit opposite effects on the glass transition. The DSC thermograms exhibit two glass transitions. That of a "core" liquid is depressed from the bulk (unconstrained) Tg. In addition, there is evidence that there is a surface layer that is constrained and has an increased Tg relative to the bulk value. Interestingly, this two-layer model depends on the observation that the total heat capacity change over the two glass transitions is the same as that for the bulk material.