Session CB - Optics; Optical Materials.
INVITED session, Saturday morning, May 03
Room 217, OLSCAMP
A Lambda-9 UV/VIS/NIR double beam, double monochromator spectrophotometer was used to record transmission and reflection of Si-implanted quartz referenced to unimplanted quartz. The quartz was implanted to 8x10^17/cm^2 at 150 keV. Transmission and reflection data were obtained for both as-implanted samples and samples annealed for 1 hour at 1200^oC in flowing Ar. The spectral range covered 250nm - 800nm (4.96eV - 1.55 eV). This information was used to calculate the absorption coefficient for the implanted Si layer. The absorption spectra will be presented and discussed.