

Magnetic resonance force microscopy (MRFM) makes use of an
ultrasensitive cantilever as a force detector capable of
detecting attoNewton scale forces. In principle, this
approach could allow for detecting the force from a single
electron or nuclear spin. The force resolution is ultimately
limited by the thermal mechanical noise in the cantilever,
which scales in power with temperature. This fact provides a
strong incentive to operate at the lowest practical
temperature. Some of the challenges of performing MRFM in
the milliKelvin regime will be discussed, in particular
devising a detection scheme that results in minimal heating
of the cantilever. We have made several improvements to a
fiber-optic interferometer that allow operation with
incident powers below 10 nW , or 20 times lower than
previously used. Other issues in combining MRFM with a
dilution refrigerator have been investigated, including
adding a damped spring system to deal with external
vibrations, and generating the GHz frequency magnetic fields
necessary for magnetic resonance.
[A7.002] A Novel MEMS Pressure Sensor Integrated with an Optical Fiber
Don C. Abeysinghe (Department of Physics, University of Cincinnati, Cincinnati, OH 45221.), Samhita Dasgupta (Taitech Inc.,AMC, P.O. Box 33630, WPAFB, OH 45433-0630, USA.), Joseph T. Boyd (ECECS, University of Cincinnati, Cincinnati, OH 45221.), Howard E. Jackson (Department of Physics, University of Cincinnati, Cincinnati, OH 45221.)
We present the design, fabrication, and characterization of
an optically interrogated MEMS pressure sensor fabricated
directly on an optical fiber. The sensor configuration
involves anodically bonding of an ultra-thin (7 µm) piece of
silicon onto the fiber end face over a cavity etched in the
central portion of this end face. The silicon diaphragm and
the cavity-fiber interface act as reflectors forming a
Fabry-Perot interferometer. Final device diameter is thus
the same as that of the optical fiber. We have employed both
200 and 400 m diameter multimode optical fibers. The
micromachining procedure includes photolithographic
patterning, wet etching of a cavity, and anodic bonding of a
silicon diaphragm. A pressure sensor fabricated on an
optical fiber has been tested displaying an approximately
linear response to static pressure (0-80 psi) with a
sensitivity of 0.1 mV/psi. This sensor is expected to find
application in situations where small size is advantageous
and where dense arrays may be useful.
[A7.003] Metastability and the Casimir Effect in Micromechanical Systems
E. Buks, M. L. Roukes (Condensed Matter Physics, California Institute of Technology, Pasadena, CA 91125)
Electrostatic and Casimir interactions limit the range of
positional stability of electrostatically-actuated or
capacitively-coupled mechanical devices. We investigate this
range experimentally for a generic system consisting of a
doubly-clamped Au suspended beam, capacitively-coupled to an
adjacent stationary electrode. The mechanical properties of
the beam, both in the linear and nonlinear regimes, are
monitored as the attractive forces are increased to the
point of instability. There "pull-in" occurs, resulting in
permanent adhesion between the electrodes. This indicates
that the free state of the system is merely
metastable, and that the state of contact (after
pull-in) has lower energy due to the strongly attractive
Casimir interaction. We investigate, experimentally and
theoretically, the position-dependent lifetimes of the free
state (existing prior to pull-in). We find that the data
cannot be accounted for by simple theory; the discrepancy
may be reflective of internal structural instabilities
within the metal electrodes.
[A7.004] MODELING AND VISUALIZATION OF MICROCRACKS DETECTION BY MAGNETIC TUNNEL JUNCTION DETECTORS
Leonid Muratov, David Lederman, Bernard R. Cooper (West Virginia University)
The presence of cracks, phase segregation, or even
submicron-sized grain boundaries creates a disruption of the
magnetic field response to an externally applied electrical
current running through the material. We have considered
disruptions of magnetic field in the external near-surface
region caused by number of typical microcracks and flaws, of
different dimensions and orientations, within the bulk of
material. These disruptions can be mapped by an array of
magnetic tunnel junctions that we are fabricating. To
implement three-dimensional visualization, using a computer
model of this array, magnetic "signatures" of flaws have
been calculated using finite element analysis. The database
of "signatures" thus generated allows fast recognition of
faults and generation of their images in real time.
Significant efforts have been made to provide an adequate
three-dimensional visualization of the shape and
distribution of microcracks, the magnetic field lines, and
delineation of the surface of the faults in relationship to
the component surface. Images can be viewed by using
inexpensive stereo-ready graphics cards for PC's, at an
ImmersaDesk, and at a portable CAVE-like system driven by
clusters of PCs.
[A7.005] Quantum Mechanical Actuation of Microelectromechanical systems by the Casimir force
H.B. Chan, V.A. Aksyuk, D.J. Bishop, Federico Capasso (Bell labs, Lucent Technologies)
MicroElectroMechanical Systems (MEMS) have become vital in
sensing and actuating applications. With further
miniaturization, quantum effects may become significant in
MEMS design and operation. The Casimir force, for example,
arises from an alteration of the zero-point electromagnetic
energy due to the boundary conditions imposed by two
uncharged metallic surfaces. We demonstrate the Casimir
effect in MEMS using a high sensitivity micromachined torque
device. The device consists of a 3.5 um thick, 500 um square
metallized polysilicon plate suspended on two of its
opposite sides by thin torsional rods above two fixed
electrodes. A 200 um metallized sphere is positioned close
to one side of the torque sensor. Attraction between the
sphere and the top plate results in a torque that rotates
the plate about the torsional rods. Differential capacitive
technique is used to detect the tilt angle with a 0.1
micro-radian resolution. The measured tilt angle is in
agreement with theoretical calculations of the Casimir force
taken into account the finite conductivity of the metal
films.
[A7.006] High-frequency Nanomechanical Structures in Silicon
L. Sekaric, M. Zalalutdinov, J. M. Parpia, H. G. Craighead (Cornell Center for Materials Research, Cornell University, Ithaca, NY 14853)
Nanoelectromechanical systems (NEMS) are of interest from
both scientific and technological standpoints. Such
structures are being considered for use as chemical and
biological sensors, force gauges and frequency filters.
Small resonant structures also open avenues for mesoscopic
studies of the mechanical properties of materials. One of
the obstacles for practical applications are intrinsic
losses which lower the mechanical quality factor of these
devices. We study high resonant frequency structures with
lateral dimensions as small as 50 nm, while trying to
understand sources of dissipation on this size scale. We
have recently reported the fabrication and excitation of
single suspended wires with resonant frequencies as high as
380 MHz. We are currently working on more sensitive
detection schemes to detect the motion of devices with
resonant frequencies above 1 GHz. Silicon and silicon
nitride mechanical resonators have been studied in our group
for material effects on dissipation. We are also focusing on
surface treatments and the effects of device geometry on
dissipation. We are also studying the effects of various
levels of doping in single-crystal silicon on dissipation
and driving schemes, a study significant for industrial use
in integration with electronic devices. The study of the
dynamics of these structures has also uncovered some very
important phenomena such as parametric amplification and
tunability. The studies of clamping losses, mechanical
isolation and induced stresses in materials are underway.
Interaction with light is also of interest.
[A7.007] Low Temperature Mechanical Dissipation in Ultrathin Single Crystal Silicon Cantilevers
Anuranjita Tewary, Kevin Y. Yasumura, Timothy D. Stowe (Department of Applied Physics, Stanford University), Thomas W. Kenny (Departmenf of Mechanical Engineering, Stanford University), Barry C. Stipe, Dan Rugar (IBM Research Division, Almaden Research Center)
Ultrathin single-crystal silicon cantilevers have been used
to demonstrate attonewton force resolution at 4K. The force
resolution of these cantilevers is limited by
thermomechanical noise, the analog of Johnson noise in a
resistor. Measurements have indicated that the mechanical
energy dissipation in ultrathin silicon cantilevers has a
strong dependence on temperature. Initial measurements of
the dissipation in an ultrathin silicon cantilever with
areas of high levels of boron doping show a broad
dissipation peak centered at about 135K and a sharp
dissipation peak centered at 13K. Thus, experiments operated
near these temperatures would suffer from reduced force
resolution. We present results from an ongoing study to
determine the physical nature of these dissipation peaks by
investigating the dissipation as a function of the material
and doping properties of the cantilevers.
[A7.008] Manipulation of magnetic particles using micro-electromagnets
C.S. Lee, H. Lee, R.W. Westervelt (Department of Physics and Division of Engineering and Applied Sciences, Harvard University)
We have fabricated micro-electromagnet devices (\muEMs) for controlling magnetic nano particles on a chip. The \muEMs consist of multiple lithographically patterned layers of \mum-scale Au wires[1] separated by transparent insulators on sapphire substrates. Magnetic field produced by these wires creates local field maximum on a plane where magnetic particles are guided. The \muEMs are designed to control the motion of Fe_3O_4 magnetic nano particles as the individual as well as a group motion of these particles is studied as the field is turned on. Actual devices fabricated include a single trap, an array of traps and a transport device. Characteristic size of devices ranges from 10 \mum to 50 \mum and the field gradient produced by these devices is ~ 100 T/m for less than 1 Amp of current. Its applications include study and control of magnetic particles as well as control and manipulation of biological organisms.
[1] M. Drndic et.al., Appl. Phys. Lett. 72, 2906 (1998).
This work was funded by ONR N00014-99-1-0347.
[A7.009] Micro-electromagnets for control of magnotactic bacteria
H. Lee, C.S. Lee, R.M. Westervelt (Department of Physics and Division of Engineering and Applied Sciences, Harvard University)
A microorganism called magnetotactic bacteria can orient and migrate along magnetic field lines due to their intracellular magnetic structure, the magnetosome, which is a chain of nano scale iron particles[1]. We have fabricated micro-electromagnet devices to control and manipulate these bacteria using their magnetic characteristics. Micro-electromagnet devices consist of layers of lithographically patterned micron scale wires that produce local magnetic field. Current densities up to 10^8 A/cm^2 and magnetic field gradient up to 100T/m were demonstrated in these devices and they have been used in atom optics to manipulate neutral atoms in vacuum[2]. The devices are designed to locally trap the bacteria, arrange them in an array and guide their motion in microscopic scale. By allowing the control of the motions of each bacterium, these devices are expected to aid study the bacteria’s behaviors.
[1] R. P. Blackmore, Science 190, 377(1975)
[2] M. Drndic et.al., Appl. Phys. Lett. 72, 2906 (1998)
This work was funded by ONR N00014-99-1-0347.
[A7.010] Quantum 1/f Noise in Resonant Tunneling Diodes
Peter H. Handel (Physics Dept., Univ. of Missouri, St. Louis, MO 63121)
Resonant tunneling diodes consist of two potential barriers
enclosing a quantum well. If the electron energy is close to
the energy level in the well, resonance occurs and a peak
I_P of the current occurs, for the voltage VP. If the
voltage increases further, only a negligibly small
non-resonant current trickle remains at the voltage V=VV.
Scattering processes that reduce the energy of the carriers
to a value close to eVP will always be present, generating a
finite current minimum IV at VV. Between VP and VV there is
a negative differential conductance G=-(IP-IV)/(VV-VP) on
the I/V curve, that is used to generate oscillations. The
1/f noise in IV is given by the conventional quantum 1/f
effect with (Dv/c)2=2eVV/m. This yields IV-2SIv(f) =2aA/f N.
Here N is given by N =tIV/e, where t is the life time of the
carriers. The quantum 1/f frequency fluctuations can be
obtained from the formula Sdw/w =(1/4Q4)SdG/G ,which was
derived in 1978. This yields Sdw/w =(1/4Q4)(4a/3p)(2eVV/mc2)
for the fractional frequency fluctuation spectrum exhibited
by the RTD if included in an RF circuit of quality factor Q.
[A7.011] Electrodynamical Quantum 1/f Noise of Elactromagnetic Helmholtz Resonators
Peter Handel (Physics Department, Univ. of Missouri, St. Louis MO 63121)
Electromagnetic Helmholtz Resonators are oscillant systems
that always include dissipative elements. If they are
oscillating in a well defined mode, they are described by a
simple harmonic oscillator equation with dissipative
coefficient g and resonance frequency w2 = wo2 + g2.
Differentiating this expression, and dividing by 2w2, we get
S(dw/w)=(1/4Q4)S(dg/g). The physical quantum mechanical
cross sections and process rates defining g must exhibit
fundamental quantum 1/f noise given by S(dg/g)
=S(ds/s)=S(dm/m)=L/f, with L=2a/pN. The spectral density of
fractional fluctuations is thus the same for the
conductivity s and electron mobility m in the resonator
walls of area A enclosing the volume V. The coherent quantum
1/f formula was used for the quantum 1/f coefficient L,
where a = e2/hc = 1/137 is the fine structure constant.
Using N=Ad, no=N/V, and a well-known expression Q=kV/AD =
w/2g; (k=1 is a geometrical factor) of the quality factor Q
in terms of the penetration depth D, we get the spectral
density of fractional fluctuations S(dw/w) =a/2pfkQ3Vno.
With n=100GHz, Q=1E4, V=0.03 cm3, no=5E22 cm-3 we obtain
S(dw/w) =1E-36/Hz.
[A7.012] Nanometer-Scale Scanning Sensors Fabricated Using Stencil Masks
A.J. Couture, Al. Champagne (Cornell University), D.C. Ralph (Cornell Univeristy)
In recent years, new forms of scanning probe microscopy have
been developed which utilize small electrical devices that
are scanned above samples to act as high-resolution sensors.
Examples include scanning single electron transistors,
scanning thermal microscopy, and gated scanning tunneling
microscopy. All of these techniques are limited in
resolution by the size of the sensor and/or the distance of
the sensor to the sample. We have developed a new technique
for fabricating scanning sensors at the 10-nm scale. Metal
devices are deposited directly onto conventional
atomic-force microscope (AFM) tips through a stencil mask.
The stencil is a suspended Si_3N_4 membrane in which
holes as small as 10 nm are fabricated using electron beam
lithography. Operating as an AFM, the probe tip is
positioned over the stencil and metal is deposited through
the hole to form the desired device pattern. We present
details of the apparatus construction as well as results of
experiments where individual cobalt nanoparticles were
deposited on tips for use in high-resolution magnetic force
microscopy.
[A7.013] Surface Tension Flows in Bent Micro-Channels: An Energy Minimization Theory versus Experiment
Benjamin Shapiro, Neil Fortner (University of Maryland at College Park), Adrian Hightower (Nanostream Inc.)
We show how surface tension flows through micro-channels can be described effectively by the solution of a constrained energy minimization. The optimization cost is equal to the total potential energy and is comprised of a liquid/air and liquid/solid part: Ep = c1 LA + c2 LS. Here LA is the surface area of the liquid/air interface and c1 is the liquid/air surface tension energy per unit area. Similiarily, LS is the solid/liquid front area and c2 is the corresponding liquid/solid energy per unit area. The optimization constraints follow from the enclosed fluid volume and the micro-channel geometry. Using the calculus of variations we show how this problem can be reduced to a simple 2 variable, 1 free parameter (p = c2/c1) optimization problem which may be solved easily. This yields the interface shape for any enclosed fluid volume, hence it says how the surface tension front propagates through the micro-channel.
Next, the theory is compared with experimental flow through
a micro-channel corner. The data is generated and filmed for
(slow) flows through bent micro-channels (about 800um wide
and 100um deep channels at <5ul per minute mass flows). We
find good agreement between the measured and predicted front
shapes for a variety of channel surfaces: both hydrophobic
and hydrophyllic.
[A7.014] Quantum Aspects of Elastic Instability in Nanostructures
Stephen M. Carr (Dept. of Physics and Astronomy Dartmouth College)
Current work in nanophysics at Dartmouth will be described. Both theoretical and experimental work will be discussed. I will also discuss my own work with double-well systems and the possibility of observing 'macroscopic' quantum phenomena using nanostructures.